Run the Reverse Recovery Double-Pulse Test

Before you run Double-Pulse characterization tests, you must set the Global Settings, configure the System Hardware, and Calibrate the System.

Reverse Recovery tests characterize the body diode in the High-Side device on the DUT Test Module. If a diode is conducting in a forward direction and immediately switched to a reverse bias condition, the diode continues to conduct in the reverse bias state for a very short time as the forward voltage bleeds off. The current through the diode is fairly large in the reverse direction during this small recovery time.

After the carriers are flushed and the diode is acting as a normal blocking device in the reverse bias condition, the current flow drops to normal leakage levels.

Use these Double-Pulse Test Modules and Oscilloscope Probes

This Reverse Recovery DPT test uses the following Test Module and Oscilloscope Probes:

  • N2819A 10:1 Differential Oscilloscope Probe for measuring Gate Current, IG.
  • PD1000-60002 Protection Probe for measuring ID.
  • N2873 10:1 Standard Oscilloscope Probe for measuring VGS on the Low-Side Gate Drive Module.
  • 10076C 100:1 High Voltage Probe for measuring VDS on the DUT Module.

a. GaN devices require a special DUT Test Board and a software license. Contact Keysight for information.

Parameter Settings

After setting the test parameters, click the Start button to start the test.